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The SMF System |
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SMF (Space Mapping Framework) is a user-friendly,
Matlab-based software system that exploits space-mapping
technology. It performs constrained minimax,
L2 or custom optimization, engineering model
enhancement and statistical analysis. It is suitable for
engineering modeling and design optimization problems. It
contains a number of features that make it especially suitable for
microwave engineering. | |
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| Features of SMF |
- SM-based optimization with flexible surrogate model definition
(input/output SM, implicit SM, frequency scaling), and optional trust
region methods
- SM-based local modeling for statistical design and analysis
- Drivers for the commercial simulators
MEFiSTo,
Sonnet
em, ADS,
FEKO
- Database support for models using commercial simulators
- SM-based interpolation for evaluating a fine model at off-grid
points
- Direct optimization modules for coarse and surrogate models
- Interactive SM interface for SM-based modeling, data acquisition,
space mapping assessment, statistical analysis, interactive SM
optimization, and space mapping tuning
- Exporting graphs, generating report files
- Saving project files
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SM-based Optimization |
- Visualization of the current status
of the optimization algorithm, the fine model response, the design
specifications, convergence measures
- Iteration-by-iteration reviewing
of the "history" of the optimization process
- Optional stopping/resuming
of the optimization procedure after any iteration with the same or changed
settings
- Support for matching real and complex responses in parameter
extraction
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SM-based Modeling |
- Local SM-based modeling for statistical analysis and design
- User-specified region of interest (model domain)
- Automatic fine model data acquisition
- Surrogate model in the form of a self-contained Matlab function
- Surrogate model testing package for model verification
- Visualization of fine and surrogate responses, and modeling error
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Statistical Analysis |
- Statistical analysis of the fine, coarse or surrogate models
- Automatic yield estimation with respect to given design
specifications and parameter deviation
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Interactive SM |
- Flexible space mapping setup
- Automatic multipoint extraction of space mapping parameters
- Automatic fine/coarse model data acquisition
- Space mapping quality assessment (separate procedures for single SM
setup, exhaustive SM setup combinations, and implicit SM)
- Estimation of matching error sensitivity with respect to space
mapping parameters
- SM-based modeling and model testing
- Interface for generating base/test points
- Surrogate optimization interface
- Storing of multiple sets of reference points, fine model responses
and space mapping parameters
- Visualization mode for observing single/multiple responses, error
plots, yield estimation and matching error statistics
- Exporting responses and SM parameters to text and ".mat" files
- Importing data from SMF databases
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Direct Coarse Model Optimization |
- Direct constrained optimization of the coarse model
- Independent setup of optimization options
- Possibility of setting the optimization outcome as the starting
point for SM optimization
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Direct Fine Model Optimization |
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Frequency Scaling |
- Nonlinear frequency scaling with polynomials up to order four
- Manual adjustment of scaling coefficients
- Automatic single/multi-point extraction of scaling coefficients
- Frequency scaling assessment interface
- Embedding of frequency scaling into the coarse model (two modes
available)
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Space Mapping Optimization with SMF
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- A block diagram of the optimization module in SMF is shown here.
Optimization is performed in several steps. First, the user enters
problem arguments, including starting point, frequency sweep,
optimization type and specifications. Next, the user sets up space
mapping itself, i.e., the kind of space mapping to be used (e.g., input,
output, implicit), specifies the termination condition, parameter
extraction options, and optional constraints.
- The next step is to link the fine and coarse models to SMF by
setting up the data that will be used to create the model drivers. Using the
user-provided data (e.g., simulator input files and design-parameter
identification data), SMF creates drivers that automatically invoke fine
and coarse model evaluations as required by the SM algorithm.
- Parameter extraction, surrogate model optimization, and optional
trust-region specific options are set in the next step using auxiliary
interfaces.
- Having done the setup, the user runs the execution interface, which
invokes the SM optimization algorithm and the output visualization. The
latter includes model responses, specification error plots as well as
convergence plots, all updated at each SM iteration.
- Space mapping optimization with SMF is explained using the
example of a microstrip bandpass filter.
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References
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- S. Koziel, J.W. Bandler, and K. Madsen,
“Space mapping optimization algorithms for engineering design,” IEEE MTT-S Int. Microwave Symp. Dig.
(San Francisco, CA, June 2006), pp. 1601-1604.
- S. Koziel and J.W. Bandler, “Space-mapping-based modeling utilizing
parameter extraction with variable weight coefficients and a data base,”
IEEE MTT-S Int. Microwave Symp. Dig. (San Francisco, CA, June 2006), pp.
1763-1766.
- J. Zhu, J.W. Bandler, N.K. Nikolova, and S. Koziel,
“Antenna design through space mapping optimization,” IEEE MTT-S Int. Microwave Symp.
Dig. (San Francisco, CA, June 2006), pp. 1605-1608.
- S. Koziel, J.W. Bandler, and K. Madsen,
“Space-mapping based interpolation for engineering optimization,” IEEE Trans. Microwave
Theory Tech., vol. 54, no. 6, pp. 2410-2421, June 2006.
- S. Koziel, J. W. Bandler, and K. Madsen,
“A space-mapping framework for engineering optimization—theory
and implementation,” IEEE Trans.
Microwave Theory Tech., vol. 54, no. 10, pp. 3721-3730,
Oct. 2006.
- S. Koziel and J.W. Bandler,
“Space mapping optimization with adaptive surrogate model,” IEEE Trans. Microwave Theory Tech., vol. 55,
2007, accepted.
- J. Zhu, J.W. Bandler, N.K. Nikolova, and S. Koziel,
“Antenna optimization through space mapping,” IEEE Trans. Antennas Propag., vol.
55, 2007, accepted.
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| Contact
john@bandler.com |
Last Updated February 19, 2007